Jack Tomsky, Ph.D
Papers

  1. "Statistical Analysis for Logistic Regressions", presented at the ASQ meeting, 2009
  2. "Statistical Analysios of Interval Data, presented at the ASQ meeting, 2009
  3.  Likelihood Methods in Estimation and Confidence Intervals for Parametric Functions presented at the ASA Meeting, San Francisco Bay Area Chapter, 2008.
  4. Empirical Bayes Acceptance Sampling, presented at the SCV ASQC Meeting, 2008.
  5. "The noncentral t distribution and its applications in the medical device industry,    presented at the millennium SIAM Conference, 2000.
  6. "How to make a fortune in the stock market using the noncentral t distribution", presented at the SCV ASQC Meeting, 1999.
  7. Stein estimates, presented at the SCV ASQC Meeting, 1998.   Statistical analysis of pharmaceutical stability tests, presented at the ASA Meeting, San Francisco Bay Area Chapter, 1998.
  8. A survey of multivariate analysis, presented at the SCV ASQC Meeting, 1997.
  9. CEP approximations for the bivariate normal distribution, presented at the AMS South-central Regional Conference, 1996.
  10.  Accelerated degradation testing, presented at the SCV ASQC Meeting, 1996.
  11.  Tolerance intervals for the normal distribution, presented at the Annual SIAM Conference, 1995.
  12.  An Arrhenius model for accelerated performance degradation, presented at the IEEE Reliability Society Meeting, 1995.
  13. Simultaneous confidence bounds for binary experiments, presented at the Seventh SIAM Conference on Discrete Mathematics, 1994.
  14. Confidence intervals for a function of several parameters, presented at the AMS Summer Meeting, 1993.
  15. Exact AOQLs in acceptance sampling, presented at the 40th Anniversary SIAM Meeting, 1992.
  16. Comparison of simultaneity tests for combined experiments, presented at the AMS Summer Meeting, 1991.
  17. A multivariate Arrhenius model for accelerated life testing, presented at the SIAM Conference on Applied Probability in Science and Engineering, 1990.
  18. Statistical tests for diagonality of a covariance matrix, presented at the AMS Summer Meeting, 1989.
  19. Tolerance intervals for the normal distribution, presented at the Annual AMS Meeting, 1989.
  20. Simultaneous confidence bounds in multivariate analysis, presented at the AMS Summer Meeting, 1988
  21. A new approximation of CEP for bivariate normal distribution, presented at the Annual AMS Meeting, 1988.
  22. A class of tests of independence between two sets of variates, presented at the Annual AMS Meeting, 1987.
  23. Computer iteration estimation of reliability extracting information from interval data (with J.M. Stampher), Computers and Industrial Engineering, Vol.11, pp. 581-585, 1986.
  24. A class of union-intersection tests for sphericity, presented at the Annual AMS Meeting, 1986.
  25. Locally most powerful invariant tests, presented at the Annual AMS Meeting, 1985.
  26. Empirical Bayes characteristics of quality control sampling plans, (With J.M. Stampher), presented at the Conference on Computers and Industrial Engineering, 1984.
  27. Analysis of variance of reliabilities, Proceedings of the Annual Reliability and Maintainability Symposium, 1983, pp. 63-70.
  28. Regression models for detecting reliability degradation, Proceedings of the Annual Reliability and Maintainability Symposium, 1982, pp. 238-245.
  29. A new class of multivariate tests based on the union-intersection principle,(with I. Olkin), Annals of Statistics, 1981, Vol.9. No. 4, pp.792-802.
  30. Confidence limits for the number of defectives in a lot, (with K. Nakano and M. Iwashika), Journal of Quality Technology, Vol.11, No.4, Oct. 1979, pp. 199-204.
  31. A statistical model for early detection of increasing failure rates, Proceedings of the Annual Reliability and Maintainability Symposium, 1978, pp. 498-503.
  32. System reliability estimation from several data sets, Proceedings of the Annual Reliability and Maintainability Symposium, 1976, pp. 18-24.
  33. Some Properties of Special-Function Distributions, (with F. McNolty), Sankhya, Vol.34, Part 3, 1972, pp. 251-264.
  34.  Letter to the editor, American Statistician, Oct. 1970.